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中国农学通报

中国农学通报 ›› 2005, Vol. 21 ›› Issue (8): 352-352.

所属专题： 小麦； 农业生态

• 目次 • 上一篇    下一篇

利用离体技术鉴定小麦根腐病抗性研究

宋庆杰   

  • 出版日期:2005-08-05 发布日期:2005-08-05

Study on resistance evaluation of spot blotch caused by H. sativum with detached leaves in wheat

Song Qingjie   

  • Online:2005-08-05 Published:2005-08-05

摘要： 通过不同处理的离体试验及田间对比试验，对离体鉴定技术应用于小麦抗叶部根腐病(H.sativum)育种的可行性进行了较深入的研究，试验证明：应用离体技术鉴定小麦叶部根腐病抗性结果准确、速度快，而且不受环境条件限制。同时，采用离体鉴定的方法对参试的2632份材料进行抗性评价，从中筛选出8份高抗和60份中抗的材料，其中17分来自人工合成六倍体小麦，51份来自普通小麦。

Abstract: We studied feasibility of wheat breeding for resistance to spot blotch caused by H. sativum using detached leaves method, the results showed that using the evaluation method of detached leaves has some advantage including nicety, fast and no influence of environments. With this method, we evaluated 2632 lines and screened 8 lines with high resistance and 60 lines with medium resistance to spot blotch. Among the resistant lines,17 are synthetic hexaploid wheat and 51 lines are common wheat.