Welcome to Chinese Agricultural Science Bulletin,

Chinese Agricultural Science Bulletin ›› 2005, Vol. 21 ›› Issue (6): 79-79.

Special Issue: 小麦 农业生态

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Resistance and RAPD Analysis of Two Variant Lines with Resistant to Scab in Wheat

Zhang Xiaohong, Chen Yaofeng, Ren Huili, Min Donghong   

  • Online:2005-06-05 Published:2005-06-05

Abstract: Two variant lines with resistant to scab in wheat,Qk-02 and Hk-04,were selected through multi-setp selection under treatment of the wheat scab pathogenic crude toxin in vitro culture of young embryo. Resistance to scab and agronomic traits of two variant lines were campared with that of their donors .The results showed that resistance to scab of two variant lines were improved obviously and integral traits were similar to that of their parents respectively.,although several agronomic traits have been changed. For verifing the variation, 524 random primers were used to amplify DNA from variant lines,their donors and Sumai 3. The results were as follows:①11 primers showed amplified product polymorphism in QK-02 variant line and its parent Xinong 1376, variation rate was 2.1%. Among them, two polymorphic DNA makers (S3471220、S3751360)were observed in Sumai 3;②15 primers showed amplified product polymorphism in HK-04 variant line and its parent Huayu 888,variation rate was 2.86%,one polymorphic DNA maker (S149620)was observed in Sumai 3,which reached the conclusion that variant lines of resistance to scab took place changes at the DNA level,and three RAPD makers(S3471220, S3751360, S149620)were related to scab resistance.