Welcome to Chinese Agricultural Science Bulletin,

Chinese Agricultural Science Bulletin ›› 2005, Vol. 21 ›› Issue (8): 352-352.

Special Issue: 小麦 农业生态

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Study on resistance evaluation of spot blotch caused by H. sativum with detached leaves in wheat

Song Qingjie   

  • Online:2005-08-05 Published:2005-08-05

Abstract: We studied feasibility of wheat breeding for resistance to spot blotch caused by H. sativum using detached leaves method, the results showed that using the evaluation method of detached leaves has some advantage including nicety, fast and no influence of environments. With this method, we evaluated 2632 lines and screened 8 lines with high resistance and 60 lines with medium resistance to spot blotch. Among the resistant lines,17 are synthetic hexaploid wheat and 51 lines are common wheat.