Abstract:

Molecular marker technology is an important genetic marker method developed after morphological, cellular and biochemical markers, which plays an important role in analyzing the molecular genetic basis of wheat traits. To systematically review international progress in this area, this paper summarizes recent findings on the mapping of molecular markers linked to yield components (thousand-grain weight, grain shape, spikelet number), quality traits (protein content, gluten content, micronutrients), and disease resistance traits (leaf rust, stripe rust, Fusarium head blight). It also outlines the key genes or QTLs identified, the types of markers used, and their current applications. Based on this, the paper analyzes several challenges in current research, including limited genetic variation within mapping populations, insufficient precision of genetic maps, and difficulties in detecting minor-effect loci. To address these issues, we propose enhancing collaboration among research institutions, constructing high-density genetic maps, accurately assessing population structure and relatedness, conducting multi-year and multi-location phenotyping, and focusing on both major and minor-effect QTLs. This review aims to provide a theoretical foundation and technical support for marker-assisted breeding of wheat in China.

Key words: wheat, yield, quality, disease resistance, molecular marker