Abstract: In order to study the effects of low temperature stress on the growth of maize and provide theoretical basis for the safety of grain production,and measured spectral parameters under low temperature stress in the key growth period of Maize, and studied the relation between spectral vegetation index and yield components. With the decrease of temperature and increase of duration under low temperature stress, there were blue shift phenomena for the position of red edge, and the amplitude and area of red edge also was reduced accordingly. At large bell stage, two peaks phenomena slowed down significantly, and it indicated that the period of low temperature had great effect on the growth of Maize.The spike weight was significantly negatively correlated with DVI(the correlation coefficient was 0.8395),and Linear model reflected the relationship between the spectral vegetation index and yield components.