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Chinese Agricultural Science Bulletin ›› 2021, Vol. 37 ›› Issue (6): 24-29.doi: 10.11924/j.issn.1000-6850.casb2020-0103

Special Issue: 小麦

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Impacting Factors of Lodging Resistance and Yield of Wheat: The Genetic and Correlation Study

Wang Rui1(), Duan Shaowei1, Guo Yong1, Kong Lingrang2, Zhang Yongke1()   

  1. 1Academy of Agronomy, Northwest A & F University, Yangling Shaanxi 712100
    2Shandong University of Agriculture, Tai’an Shandong 271000
  • Received:2020-05-14 Revised:2020-07-24 Online:2021-02-25 Published:2021-02-24
  • Contact: Zhang Yongke E-mail:wangrui1471@126.com;zhanggyonggke@sina.com

Abstract:

The aim is to provide a basis for improving lodging resistance and yield of wheat. 82 recombinant inbred lines (RILs) from the same combination of Triticum dicoccoides were used as materials. The correlation between lodging resistance impacting factors and yield of wheat were analyzed in the test station of Northwest A & F University. The results showed that: (1) there was a negative correlation between plant height and lodging resistance, while there was a positive correlation between stem thickness and lodging resistance; the order of the lodging resistance of the characters was: plant height>stem thickness>grain weight per spike>grain weight per plant; (2) the grain width and grain number per spike were extremely and significantly correlated to grain weight per spike (0.413**, 0.767**); (3) lodging decreased thousand kernels weight and grain weight per panicle resulting in yield reduction; (4) the hybrid segregation generations of the impacting factors of lodging resistance and yield factors, such as spikelets, kernels per spike, grain number per spike, showed the genetic characteristics of closing to low parent, the frequency of descendants close to high parent was 1.5988%, the minimum of plants should be kept at 120 in F2. Thicker stem wall, moderate plant height, bigger and fuller kernel as well as grain number per spike should be selected in hybrid segregation generations for lodging resistance and high yield in breeding.

Key words: wheat, stem thickness, lodging resistance, yield factors, genetic characteristics

CLC Number: